KLA | Leaders in Process Control & Yield Management
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Thin-Film Thickness Measurement | Thin-Film Metrology - KLA
WEBProvides in situ, real-time measurement of deposition rate, film thickness, and optical constants (n and k) for the analysis of film uniformity and composition of semiconductor and dielectric layers. Learn more.
KLA Corporation - Wikipedia
WEBKLA Corporation is an American capital equipment company based in Milpitas, California. It supplies process control and yield management systems for the semiconductor industry and other related nanoelectronics industries.
Metrology | Chip Manufacturing - KLA
WEBKLA has Software Solutions that centralize and analyze chip manufacturing metrology data, including OVALiS and 5D Analyzer. KLA's comprehensive metrology portfolio includes Archer, ATL, SpectraShape, SpectraFilm, Aleris, …
KLA-Tencor ASET F5x Thin Film Measurement System
WEBKLA-TENCOR ASET F5x THIN FILM MEASUREMENT SYSTEM Consisting of: - Model: ASET F5x - Configured for 200mm wafers with Dual Cassette Open Handler - 150mm wafer handling is available (please inquire) - 300mm wafer handling is available with handler change (please inquire) - Spectroscopic Ellipsometer
About Olsa | Olsa
WEBWe believe that our research for cutting-edge technologies and advanced engineering solutions can lead to significant improvements in energy consumption and strive each day to find the best solutions for efficiency and resources …
KLA Instruments Webinars
WEBThin Films & Coatings Technology Symposium: Adhesion of Low-k Films on Si by Nano-scratch. Jennifer Hay of KLA Instruments demonstrates use of the iMicro nanoindenter to evaluate adhesion of low-k dielectric ... Posted Thursday, September 1, 2022. 31:48.
Film Metrology Tools - Environmental XPRT
WEBThe Aleris Family of film metrology tools provides reliable and precise measurement of film thickness, refractive index, stress and composition for the 32nm node and beyond.
KLA Corporation (KLAC) - Yahoo Finance
WEBFind the latest KLA Corporation (KLAC) stock quote, history, news and other vital information to help you with your stock trading and investing.
(PDF) Model selection in spectroscopic ellipsometry data …
WEBNov 1, 2017 · Abstract and Figures. In the field of optical metrology, the selection of the best model to fit experimental data is absolutely nontrivial problem. In practice, this is a very subjective and ...
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